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Updated: Jul 9, 2026

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
Published on: October 24, 2014
Fundamentals and model of photonic-force microscopy
Abstract:
Exact calculations of the near-field electromagnetic force on a nanoparticle exerted by the presence of a corrugated dielectric interface are carried out. The illumination of this system excites the particle eigenmodes. The calculation is two-dimensional, so the nanoparticle is actually a nanocylinder that scans parallel to the interface. This system constitutes a model of force transduction and surface topography imaging for a photonic-force microscope with signal enhancement owing to morphological resonance excitation of the probe.
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