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Ensemble Force Spectroscopy by Shear Forces

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Shear force control for a terahertz near field microscope.

F Buersgens¹, G Acuna, C H Lang

¹Photonics and Optoelectronics Group, University of Munich, Amalienstr. 54, 80799 Munich, Germany.

The Review of Scientific Instruments

|December 7, 2007

Summary

Apertureless terahertz microscopy now achieves extreme subwavelength resolution using active shear force control. This technique precisely maintains tip-surface distance, enabling high-contrast images reflecting surface dielectric properties.

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Area of Science:

Physics
Materials Science
Nanotechnology

Background:

Terahertz microscopy offers unique material probing capabilities.
Achieving high spatial resolution in terahertz microscopy has been a significant challenge.

Purpose of the Study:

To advance apertureless terahertz microscopy.
To achieve extreme subwavelength spatial resolution and maximized image contrast.

Main Methods:

Implementing active shear force control for scanning probe microscopy.
Maintaining a precise tip-surface distance of approximately 20 nm.

Main Results:

Demonstrated extreme subwavelength spatial resolution.
Achieved maximized image contrast in terahertz imaging.
Terahertz images directly correlate with the surface's dielectric permittivity.

Conclusions:

Active shear force control is a key advancement for high-resolution terahertz microscopy.
The technique enables detailed mapping of surface dielectric properties at the nanoscale.