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Related Experiment Video

Updated: Jul 9, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

A low temperature scanning tunneling microscope for electronic and force spectroscopy.

R H M Smit¹, R Grande, B Lasanta

¹Laboratorio de Bajas Temperaturas, Departamento Física de la Materia Condensada C-III, Universidad Autónoma de Madrid, E-28049 Madrid, Spain. smit@physics.leidenuniv.nl

The Review of Scientific Instruments

|December 7, 2007

Summary

We developed a new method to add force measurement capabilities to low-temperature scanning tunneling microscopes. This technique enhances atomic-scale imaging and spectroscopy with precise force data.

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Last Updated: Jul 9, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

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Published on: January 19, 2018

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Area of Science:

Physics
Materials Science
Nanotechnology

Background:

Low-temperature scanning tunneling microscopy (LT-STM) is a powerful surface science technique.
Measuring forces simultaneously with STM is challenging but offers enhanced capabilities.

Purpose of the Study:

To introduce and validate a novel method for integrating force measurements into LT-STM.
To enable combined force and electronic measurements using versatile tip options.

Main Methods:

Utilizing a high-quality factor, high-resolution tuning fork for force detection.
Ensuring compatibility with various bulk tips, including superconductive and magnetic ones.
Implementing in situ, high-precision calibration of the tuning fork's amplitude and spring constant.

Main Results:

Successfully extended LT-STM with reliable force measurement capabilities.
Demonstrated the compatibility with diverse tip types for advanced spectroscopy.
Achieved easy and precise in situ calibration of force sensor parameters.

Conclusions:

The novel technique significantly enhances LT-STM by adding force sensing.
This method opens new avenues for combined atomic-scale imaging, spectroscopy, and force measurements.
The approach is versatile, allowing for precise calibration and use of specialized tips.