Thermal quenching sample chamber for grazing incidence small angle x-ray scattering studies of polymer films

The second generation of a sample chamber designed for in situ measurement of temperature- and time-dependent polymer film nanostructure using the method of grazing incidence small angle x-ray scattering is presented. An increased operating temperature limit (from 260 to 400 degrees C) with precise control (+/-0.1 degrees C) at fixed temperatures as well as a fourfold increase in maximum instantaneous cooling rate (up to 73 degrees C/s) relative to the first generation chamber [M. N. Groves et al, J. Appl. Crystallogr. 39, 120 (2006)] are reported. Thermal quenches from 220 to 90 degrees C are shown to be reproducible to within +/-1 degrees C of the final temperature. Experimental tests on spin-coated films of symmetric diblock styrene-butadiene copolymer demonstrate the ability to resolve the kinetics of orientation of lamellar domains parallel to the silicon substrate, distinct from the initial formation of randomly oriented lamellar domains immediately following the thermal quench.