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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

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Active drift compensation applied to nanorod manipulation with an atomic force microscope.

E Tranvouez¹, E Boer-Duchemin, G Comtet

¹Laboratoire de Photophysique Moléculaire, Université Paris-Sud, 91405 Orsay, France. edern.tranvouez@u-psud.fr

The Review of Scientific Instruments

|December 7, 2007

Summary

We developed a simple algorithm to counteract thermal drift in atomic force microscopy (AFM). This method allows stable AFM tip positioning over nanorods for over 90 minutes, enabling precise manipulation.

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Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains

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Published on: July 20, 2022

Area of Science:

Nanotechnology
Surface Science
Microscopy

Background:

Atomic Force Microscopy (AFM) is crucial for nanoscale imaging and manipulation.
Thermal drift presents a significant challenge for long-term AFM operations, especially under ambient conditions.
Precise manipulation of nanostructures like cadmium selenide (CdSe) nanorods requires stable AFM tip control.

Purpose of the Study:

To develop and demonstrate a simple algorithm for compensating thermal drift in AFM.
To enable stable, long-term AFM tip positioning over nanostructures.
To apply the drift compensation technique for precise manipulation of CdSe nanorods.

Main Methods:

Development of a novel algorithm for real-time thermal drift compensation in AFM.
Experimental validation using a 5-nm-high, 50-nm-long CdSe nanorod on a highly oriented pyrolytic graphite surface.
Application of the drift-compensated AFM for controlled translation and rotation of nanorods.

Main Results:

The developed algorithm effectively compensated for thermal drift (6 nm/min).
Stable AFM tip positioning above a CdSe nanorod was maintained for over 90 minutes.
Precise manipulation, including translation and rotation, of CdSe nanorods was achieved.

Conclusions:

The proposed drift compensation algorithm is effective for ambient AFM operations.
This technique significantly enhances the stability and precision of AFM for nanostructure manipulation.
The method opens possibilities for more complex nanoscale assembly and characterization.