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IR Spectrometers

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...

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A Multimodal Wide-Field Fourier-Transform Raman Microscope

A Multimodal Wide-Field Fourier-Transform Raman Microscope

Published on: December 30, 2025

4Pi spectral self-interference microscopy.

Brynmor J Davis¹, Mehmet Dogan, Bennett B Goldberg

¹Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA. bryn@uiuc.edu

Journal of the Optical Society of America. A, Optics, Image Science, and Vision

|December 7, 2007

Summary

Spectral self-interference microscopy (SSM) overcomes resolution limits by integrating a 4Pi apparatus. This innovation enhances axial localization precision and lateral resolution for nanoscale imaging.

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Area of Science:

Optics
Microscopy
Nanotechnology

Background:

Spectral self-interference microscopy (SSM) enables nanometer-scale axial localization of emitters.
SSM requires significant optical path differences, necessitating low-numerical-aperture objectives and limiting lateral resolution.

Purpose of the Study:

To overcome the lateral resolution limitation of spectral self-interference microscopy.
To generalize SSM and 4Pi microscopy into a single apparatus.
To quantify the resolution limits of SSM.

Main Methods:

Integration of a 4Pi microscopy apparatus with spectral self-interference microscopy.
Utilizing the 4Pi setup to generate two distinct optical paths to the detector.
Quantifying the resolution of the generalized SSM system.

Main Results:

The developed instrument combines features of both SSM and 4Pi microscopy.
The lateral resolution limitation of SSM was successfully overcome.
SSM was demonstrated to be subject to the same resolution constraints as 4Pi microscopy.

Conclusions:

The generalized SSM-4Pi system offers improved resolution for nanoscale imaging.
This approach enhances the applicability of SSM in fields requiring high-resolution imaging.
The study provides a quantitative understanding of SSM's resolution capabilities.