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Updated: Jul 9, 2026

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
09:26

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

Published on: June 26, 2015

On testing dependence between time to failure and cause of failure when causes of failure are missing

Isha Dewan1, Sangita Kulathinal

  • 1Indian Statistical Institute, New Delhi, India.

Plos One
|December 7, 2007
PubMed

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