STEM nanodiffraction technique for structural analysis of CoPt nanoparticles
D Alloyeau1, C Ricolleau, T Oikawa
1Laboratoire Matériaux et Phénomènes Quantiques, Université Paris 7, 2 Place Jussieu, 75251 Paris, France. alloyeau@onera.fr <alloyeau@onera.fr>
This study introduces a new TEM method to analyze single nanoparticle structures. This technique reveals size-dependent order-disorder transitions in cobalt-platinum nanoparticles smaller than 3 nm.
Area of Science:
- Materials Science
- Nanotechnology
- Physical Chemistry
Background:
- Correlating nanoparticle structure with size requires linking imaging and diffraction data.
- Conventional nanobeam diffraction is time-consuming for randomly oriented nanoparticles.
Purpose of the Study:
- To develop an improved method for analyzing single nanoparticle structures and their size-dependent properties.
- To investigate size effects on the order-disorder transition temperature in cobalt-platinum nanoparticles.
Main Methods:
- Utilized a finely tuned, parallel STEM nanoprobe (1 nm, <1 mrad convergence angle) in TEM.
- Controlled STEM nanoprobe positioning to acquire diffraction patterns from individual nanoparticles selected in STEM images.
- Applied Bright and Dark Field STEM (BF/DF STEM) modes for enhanced analysis.
Main Results:
- Successfully obtained diffraction patterns from numerous single nanoparticles.
- Demonstrated a correlation between nanoparticle size and structural properties.
- Observed size effects on the order-disorder transition temperature in cobalt-platinum nanoparticles below 3 nm.
Conclusions:
- The developed BF/DF STEM technique offers an efficient alternative to nanobeam diffraction for single nanoparticle structural analysis.
- Nanoparticle size significantly influences the order-disorder transition temperature, particularly for sizes below 3 nm.
- This method facilitates the study of size-dependent phenomena in nanomaterials.
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