Overview of Microscopy Techniques
Atomic Force Microscopy
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Petr Klapetek1, Jirí Bursík, Miroslav Valtr
1Czech Metrology Institute, Okruzní 31, 638 00 Brno, Czech Republic. klapetek@physics.muni.cz <klapetek@physics.muni.cz>
Far-field radiation diagrams offer an efficient method for daily quality checks of Near-field scanning optical microscopy (NSOM) probes. This technique also effectively distinguishes between different NSOM probe geometries based on their directional radiation patterns.
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