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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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Near-field effects of focused illumination on periodic structures in scanning tunneling optical microscopy

F I Baida1, D Barchiesi, D Van Vanlabeke

  • 1Laboratoire d'Optique P. M. Duffieux, Unité Mixte de Recherche 6603, Institut de Microtechniques de Franche-Comté FR0067, Centre National de Recherche Scientifique, Université de Franche-Comté, 25030 Besançon Cedex, France.

Optics Letters
|December 15, 2007
PubMed

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