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Related Concept Videos

Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

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Related Experiment Video

Updated: Jul 9, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Electron holography with a Cs-corrected transmission electron microscope.

Dorin Geiger1, Hannes Lichte, Martin Linck

  • 1Institute for Structure Physics, Triebenberg Laboratory, Technische Universität Dresden, D-01062 Dresden, Germany. Dorin.Geiger@Triebenberg.de

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|December 22, 2007
PubMed
Summary
This summary is machine-generated.

Cs-corrected transmission electron microscopy (TEM) combined with off-axis electron holography significantly enhances atomic-scale imaging. This powerful combination overcomes limitations of conventional methods, enabling complete object wave reconstruction and detailed analysis.

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Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
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Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

Related Experiment Videos

Last Updated: Jul 9, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

Area of Science:

  • Materials Science
  • Physics
  • Chemistry

Background:

  • Cs (Cesiium) correctors in transmission electron microscopy (TEM) improve resolution to the atomic scale.
  • Conventional TEM intensity images lack phase information, hindering the analysis of electric fields and magnetic domains.
  • Off-axis electron holography can recover complete object wave information but is limited by microscope aberrations.

Purpose of the Study:

  • To investigate the synergistic benefits of combining Cs-corrected TEM with off-axis electron holography.
  • To enhance the phase detection limit and overall performance of electron holography.
  • To enable complete atomic-scale analysis in TEM.

Main Methods:

  • Implementation of off-axis electron holography on a Cs-corrected TEM.
  • Quantitative analysis of signal-to-noise properties and phase detection limits.
  • Exploration of a posteriori correction for residual aberrations.

Main Results:

  • A four-fold improvement in the phase detection limit was achieved.
  • The combination allows for complete reconstruction of the object wave.
  • Residual aberrations can be corrected post-acquisition.

Conclusions:

  • Combining Cs-corrected TEM with off-axis electron holography offers new possibilities for complete atomic-scale TEM analysis.
  • This approach overcomes limitations of individual techniques, providing richer object information.
  • Enables detailed study of atomic electric-field and magnetic domain structures.