Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Scanning Electron Microscopy

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...

Surface Area Calculations

Surface Area Calculations

Surface area calculations for a graph z = f(x, y) are fundamental in engineering applications involving curved structures such as satellite dishes. A parabolic dish reflects communication signals efficiently, but engineers must determine its exact curved surface area to estimate coating materials, fabrication costs, and structural requirements. Since the rim of the dish forms a circular boundary, the surface area is calculated over a circular domain in the xy-plane.Parametric Representation of...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Leaky surface electromagnetic waves on a high-index dielectric grating.

Optics letters·2016

Same author

Controlling quantum-dot light absorption and emission by a surface-plasmon field.

Optics express·2014

Same author

Numerical solutions of the Rayleigh equations for the scattering of light from a two-dimensional randomly rough perfectly conducting surface.

Journal of the Optical Society of America. A, Optics, image science, and vision·2014

Same author

Surface plasmon polariton Wannier-Stark ladder.

Optics letters·2014

Same author

Satellite peaks in the scattering of light from the two-dimensional randomly rough surface of a dielectric film on a planar metal surface.

Optics express·2012

Same author

Transmission through a Kerr barrier in photonic crystal waveguides: dispersion effects.

Journal of physics. Condensed matter : an Institute of Physics journal·2011

Search research articles

Related Experiment Video

Updated: Jul 8, 2026

Scattering And Absorption of Light in Planetary Regoliths

Scattering And Absorption of Light in Planetary Regoliths

Published on: July 1, 2019

Determination of surface profile statistics from electromagnetic scattering data.

V Malyshkin, S Simeonov, A R McGurn

|January 1, 1997

Summary

A novel reverse Monte Carlo method accurately determines surface profile statistics from electromagnetic radiation scattering data. This technique successfully extracts surface power spectra, showing excellent agreement with contact profilometry measurements.

More Related Videos

Controlled Synthesis and Fluorescence Tracking of Highly Uniform Poly(N-isopropylacrylamide) Microgels

Controlled Synthesis and Fluorescence Tracking of Highly Uniform Poly(N-isopropylacrylamide) Microgels

Published on: September 8, 2016

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation

Published on: March 2, 2021

Related Experiment Videos

Last Updated: Jul 8, 2026

Scattering And Absorption of Light in Planetary Regoliths

Scattering And Absorption of Light in Planetary Regoliths

Published on: July 1, 2019

Controlled Synthesis and Fluorescence Tracking of Highly Uniform Poly(N-isopropylacrylamide) Microgels

Controlled Synthesis and Fluorescence Tracking of Highly Uniform Poly(N-isopropylacrylamide) Microgels

Published on: September 8, 2016

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation

Published on: March 2, 2021

Area of Science:

Physics
Optics
Materials Science

Background:

Characterizing rough surfaces is crucial in optics and materials science.
Differential reflection data provides insights into surface topography.
Existing methods for surface profile determination can be limited.

Purpose of the Study:

To introduce a new reverse Monte Carlo (RMC) method for analyzing surface profile statistics.
To extract the surface profile power spectrum from differential reflection data.
To validate the RMC method against experimental scattering data and contact profilometry.

Main Methods:

Development of a novel reverse Monte Carlo (RMC) algorithm.
Application of the RMC method to analyze differential reflection data of electromagnetic radiation scattered from rough surfaces.
Comparison of RMC-derived surface power spectra with those obtained from contact profilometry.

Main Results:

The RMC method successfully determined surface profile statistics from scattering data.
The extracted power spectrum of the surface profile showed excellent agreement with contact profilometry measurements.
The study validates the efficacy of the new RMC approach for surface characterization.

Conclusions:

The new RMC method is a powerful tool for determining surface profile statistics.
This technique offers a reliable way to extract surface power spectra from scattering data.
The RMC method provides an accurate alternative to traditional surface measurement techniques.