Dosimetric verification of a Monte Carlo electron beam model for an add-on eMLC

T Vatanen1, E Traneus, T Lahtinen

  • 1Department of Oncology, Kuopio University Hospital, Box 1777, FIN-70211 Kuopio, Finland. tvatanen@hytti.uku.fi

Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Applications of EMF Measurements01:26

Applications of EMF Measurements

Electromotive force (EMF) measurements have a broad range of applications in various fields, including chemistry and physics. The electrochemical series, an arrangement of elements in order of their standard electrode potentials, can be determined through EMF measurements. Elements with lower standard potentials can reduce ions of elements with higher standard potentials.The standard cell potential, E°, allows for the calculation of the standard reaction Gibbs energy, ΔG°, and the equilibrium...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.