Photometric measurement of linear crystallization velocity on a microscale

Use of a photometer-equipped polarizing microscope permits the measurement of linear crystallization velocity in a flexible manner. Ease of sample preparation and manipulation compared with conventional methods for measuring crystallization velocity are among the advantages of the method reported here. A simple barrier layer silicon photodetector in short-circuit operation gives the fast response necessary to follow the moving solid-liquid interface. Sample results on the crystallization of alpha- and beta-resorcinol illustrate the utility of this method.