Related Experiment Video
Updated: Jul 8, 2026
12:32
The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors
Published on: May 24, 2020
Optical properties of codeposited aluminum-silicon composite films
1Bell Laboratories, Crawfords Corner Road, Holmdel, New Jersey 07733, USA.
Applied Optics
|April 15, 1983
Abstract:
Aluminum-silicon composite films consisting of a mixture of aluminum and silicon particles were produced by electron-beam coevaporation. The reflectivity of samples with < or approximately 33-vol % Si was in good agreement with the Bruggeman theory with no adjustable parameters. No parallel-band absorption peak due to the aluminum was detected analogously to the behavior of microcrystalline aluminum films.
