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Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization
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Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization

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Variations in the polarization sensitivity of microchannel plates with photon incidence angle and wavelength in the

J Tomc, P Zetner, W B Westerveld

    Applied Optics
    |March 1, 1984
    PubMed
    Abstract

    No abstract available in PubMed .

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