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Atomic Layer Deposition of Vanadium Dioxide and a Temperature-dependent Optical Model
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Raman characterization of all-dielectric multilayer SiO2/TiO2 optical coatings

G J Exarhos, W T Pawlewicz

    Applied Optics
    |June 15, 1984
    PubMed
    Abstract

    No abstract available in PubMed .

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