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Related Concept Videos

Interference and Diffraction02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
Flame Photometry: Overview01:02

Flame Photometry: Overview

Flame photometry, also known as flame emission spectrometry, is a technique used for the qualitative and quantitative analysis of elements present in a sample using a flame as the source of excitation energy. The concept of flame photometry was realized in the early 1860s by Kirchhoff and Bunsen, who discovered that specific elements emit characteristic radiation when excited in flames. The first instrument developed for this purpose was used to measure sodium (Na) in plant ash using a Bunsen...
Atomic Spectroscopy: Effects of Temperature01:27

Atomic Spectroscopy: Effects of Temperature

Atomization, converting samples into gas-phase atoms and ions, is essential for atomic spectroscopy. The flame temperature required for atomization affects the efficiency of the atomic spectroscopic methods by increasing the atomization efficiency and the relative population of the excited and ground states.
At thermal equilibrium, the relative populations of excited and ground state atoms can be estimated using the Maxwell–Boltzmann distribution. For example, an increase in temperature from...
Flame Photometry: Lab01:16

Flame Photometry: Lab

In a flame photometer, when a solution like potassium chloride is aspirated into the flame, the solvent evaporates, leaving behind dehydrated salt. This salt dissociates into free gaseous atoms in their ground state. Some of these atoms absorb energy from the flame, leading to their excitation. The excited atoms return to the ground state, emitting photons at characteristic wavelengths. Because only electronic transitions are involved, the resulting emission lines are very narrow. The intensity...
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
Temperature Dependent Deformation01:12

Temperature Dependent Deformation

In a nonhomogeneous rod made up of steel and brass, restrained at both ends and subjected to a temperature change, several steps are involved in calculating the stress and compressive load. Due to the problem's static indeterminacy, one end support is disconnected, allowing the rod to experience the temperature change freely. Next, an unknown force is applied at the free end, triggering deformations in the rod's steel and brass portions. These deformations are then calculated and added together...

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Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

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Same author

Laser Rayleigh scattering for flame thermometry in a toroidal jet stirred combustor.

Applied optics·2010
Same author

Measurements of temperature distribution of flames by moire deflectometry.

Applied optics·2010
Same author

Deflection mapping of flames using the moire effect.

Applied optics·1984
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Temperature mapping in flames by moire deflectometry.

Applied optics·1983

Related Experiment Video

Updated: Jul 8, 2026

Fiber Optic Distributed Sensors for High-resolution Temperature Field Mapping
09:48

Fiber Optic Distributed Sensors for High-resolution Temperature Field Mapping

Published on: November 7, 2016

Effect of diffraction on the moire image for temperature mapping in flames

E Bar-Ziv

    Applied Optics
    |November 15, 1984
    PubMed
    Summary

    No abstract available in PubMed .

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