Curve tracking for rapid imaging in AFM

A high-level feedback control approach for rapid imaging in atomic force microscopy is presented. The algorithms are designed for samples which are string-like, such as biopolymers, and for boundaries. Rather than the simple raster-scan pattern, data from the microscope are used in real-time to steer the tip along the sample, drastically reducing the area to be imaged. An order-of-magnitude reduction in the time to acquire an image is possible. The technique is illustrated through simulations and through physical experiments.