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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

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Aberration-free linear holographic scanner and its application to a diode-laser printer

H Iwaoka, T Shiozawa

    Applied Optics
    |January 1, 1986
    PubMed
    Abstract

    No abstract available in PubMed .

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