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Updated: Jul 7, 2026

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
Published on: July 12, 2016
Indications for enhanced auger-electron absorption in a hot-electron gas
G Schiwietz1, M Roth, K Czerski
1Hahn-Meitner-Institut, Bereich SF, Glienicker Strasse 100, 14109, Berlin, Germany.
Ion-track dynamics significantly alter Auger-electron angular distributions, deviating from the typical cosine law. These variations reveal sensitivity to high-energy deposition, impacting electron yields and spatial excitation patterns.
Area of Science:
- Physics
- Materials Science
- Surface Science
Background:
- Auger-electron angular distributions in solids typically follow a cosine law, largely independent of excitation type at low energies.
- Understanding electron emission dynamics is crucial for surface analysis techniques.
Purpose of the Study:
- To investigate how ion-track dynamics and high electron temperatures influence Auger-electron angular distributions.
- To determine the sensitivity of Auger electron yields to high-energy deposition density.
Main Methods:
- Analysis of Auger-electron angular distributions under conditions of high energy deposition.
- Comparison of experimental or simulated data with theoretical models.
Main Results:
- Ion-track dynamics and high electron temperatures cause significant deviations from the standard cosine law for Auger-electron emission.
- Ratios of Auger electron yields for different ionization states show angular dependence sensitive to energy deposition density.
- A minimum in these ratios is observed near the ion-track direction, indicating enhanced energy loss or absorption.
Conclusions:
- Auger-electron angular distributions are not universally independent of excitation conditions, particularly under high energy deposition.
- The observed angular variations provide insights into the spatial distribution of electronic excitations and energy dissipation processes.
- This finding has implications for the interpretation of Auger electron spectroscopy data in ion-irradiated materials.
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