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Microtensiometer for Confocal Microscopy Visualization of Dynamic Interfaces
Published on: September 9, 2022
Biased surface fluctuations due to current stress
O Bondarchuk1, W G Cullen, M Degawa
1Department of Physics, University of Maryland at College Park, College Park, Maryland 20742-4111, USA.
Abstract:
Direct correlation between temporal structural fluctuations and electron wind force is demonstrated, for the first time, by STM imaging and analysis of atomically resolved motion on a thin film surface under large applied current (10(5) A/cm2). The magnitude of the momentum transfer between current carriers and the geometrically constrained atoms in the fluctuating structure is at least 5x to 15x (+/-1sigma range) larger than for freely diffusing adatoms. Corresponding changes in surface resistivity will contribute significant fluctuation signature to nanoscale electronic properties.
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