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Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
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Measurement of scattering rate and minimum conductivity in graphene

Y-W Tan1, Y Zhang, K Bolotin

  • 1Department of Physics, Columbia University, New York, New York 10027, USA.

Physical Review Letters
|February 1, 2008
PubMed

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