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Bulk and Thin Film Synthesis of Compositionally Variant Entropy-stabilized Oxides
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Published on: May 29, 2018

Domain switching kinetics in disordered ferroelectric thin films.

J Y Jo1, H S Han, J-G Yoon

  • 1ReCOE&FPRD, Department of Physics and Astronomy, Seoul National University, Seoul 151-747, Korea.

Physical Review Letters
|February 1, 2008
PubMed
Summary

We studied ferroelectric domain kinetics in lead zirconate titanate films. A Lorentzian distribution of domain switching times, influenced by local field variations from defects, explains their behavior in ferroelectric memories.

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Solid-State Chemistry

Background:

  • Lead zirconate titanate (Pb(Zr,Ti)O3) films are crucial for ferroelectric memory devices.
  • Understanding their domain kinetics is essential for device performance and reliability.

Purpose of the Study:

  • To investigate the domain kinetics of (111)-preferred polycrystalline Pb(Zr,Ti)O3 films.
  • To elucidate the factors governing polarization switching behaviors under varying conditions.

Main Methods:

  • Measurement of polarization switching behaviors in Pb(Zr,Ti)O3 films.
  • Analysis of switching dynamics across a range of electric fields and temperatures.
  • Modeling domain switching using a Lorentzian distribution of logarithmic times.

Main Results:

  • Switching behaviors were successfully modeled using a Lorentzian distribution of logarithmic domain-switching times.
  • This distribution effectively explains the observed polarization switching dynamics.
  • Local field variations arising from dipole defects at pinning sites were identified as a potential cause.

Conclusions:

  • The study provides a kinetic model for domain switching in ferroelectric films.
  • Dipole defects and local field variations play a significant role in domain pinning and switching dynamics.
  • The findings contribute to the understanding and design of advanced ferroelectric memory materials.