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A study of vacancy-related defects in (Pb,La)(Zr,Ti)O(3) thin films using positron annihilation

T Friessnegg1, S Aggarwal, B Nielsen

  • 1Maryland Univ., College Park, MD, USA.

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
|February 2, 2008
PubMed

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