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Updated: Jul 7, 2026
09:10
Fabrication and Testing of Microfluidic Optomechanical Oscillators
Published on: May 29, 2014
Performance evaluation of an optoelectronic oscillator.
S Romisch1, J Kitching, E Ferre-Pikal
1Nat. Inst. of Stand. and Technol., Boulder, CO.
Summary
This study presents novel phase noise measurements for optoelectronic oscillators (OEOs) at low frequencies, revealing key noise sources and enabling performance prediction from component parameters.
Area of Science:
- Physics
- Electrical Engineering
- Optoelectronics
Background:
- Optoelectronic oscillators (OEOs) are critical for high-frequency applications.
- Characterizing phase noise at low Fourier frequencies is essential for OEO performance.
- Previous studies have not comprehensively addressed low-frequency phase noise in OEOs.
Purpose of the Study:
- To present the first phase noise measurements of an OEO at frequencies below 10 Hz from the carrier.
- To analyze the impact of amplifier phase noise and environmental factors on oscillator noise.
- To develop a generalized model for predicting OEO performance based on individual component parameters.
Main Methods:
- Phase noise measurements were conducted on an OEO at 10.6 GHz.
- Allan variance was measured to assess frequency stability.
- A generalized noise model was employed to analyze experimental data.
Main Results:
- The OEO exhibited a single-side-band (SSB) phase noise of -123 dB/Hz at 10 kHz from the carrier.
- The measured Allan variance reached sigma(y)(tau)=10(-10) for integration times between 1 and 10 seconds.
- Experimental results confirmed the significant influence of amplifier phase noise and environmental fluctuations.
Conclusions:
- The study provides the first detailed low-frequency phase noise characterization of an OEO.
- The developed model accurately predicts oscillator performance from component parameters.
- This work is crucial for optimizing OEOs in applications requiring high frequency stability.
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