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Updated: Jul 7, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

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Frequency shifts in cesium beam clocks induced by microwave leakages

B Boussert1, G Theobald, P Cerez

  • 1CNRS, Univ. de Paris-Sud, Orsay.

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
|February 5, 2008
PubMed

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