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Reflection-mode scanning near-field optical microscopy using an apertureless metallic tip.

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Area of Science:

Nanotechnology
Optical Microscopy
Surface Science

Background:

Near-field optical microscopy offers high resolution but often requires complex sample preparation.
Previous apertureless reflection-mode microscopes achieved 100-nm resolution.

Purpose of the Study:

To confirm and demonstrate the enhanced capabilities of a reflection-mode near-field optical microscope.
To achieve and validate a 20-nm resolution using smaller tungsten tips.
To show independent probing of sample topography and near electromagnetic fields.

Main Methods:

Utilizing an apertureless tungsten tip in a reflection-mode near-field optical microscope.
Recording optical signals in parallel with tapping-mode atomic force microscopy (AFM).
Employing interference phenomena between a Rayleigh scatterer and its image.

Main Results:

Achieved a resolution of 20 nm (approximately lambda/35) with smaller tips.
Demonstrated independent imaging of sample topography and near electromagnetic field.
Confirmed the capabilities of the reflection-mode near-field optical microscope.

Conclusions:

The reflection-mode near-field optical microscope with an apertureless tungsten tip is capable of achieving 20-nm resolution.
The technique allows for simultaneous and independent characterization of surface topography and optical properties.
This method provides a powerful tool for nanoscale imaging and material analysis.