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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Jul 7, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
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Published on: February 27, 2013

Wavelength scanning profilometry for real-time surface shape measurement.

S Kuwamura, I Yamaguchi

    Applied Optics
    |July 1, 1997
    PubMed
    Summary

    This study introduces wavelength scanning profilometry for real-time surface measurement. This technique provides an accurate height map of surfaces, improving with scan progression.

    Area of Science:

    • Optical Metrology
    • Surface Characterization
    • Real-time Measurement Systems

    Background:

    • Traditional surface measurement techniques can be time-consuming.
    • The need for rapid, high-accuracy surface profiling is critical in various industries.

    Purpose of the Study:

    • To propose and demonstrate a novel wavelength scanning profilometry method.
    • To enable real-time surface shape measurement with high accuracy.

    Main Methods:

    • Utilizing a tunable dye laser for wavelength scanning.
    • Measuring the phase slope of interference signals at individual pixels.
    • On-line processing to generate real-time height maps.

    Main Results:

    • A height map of the surface is available at any moment during the scan.

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    Last Updated: Jul 7, 2026

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  • Measurement accuracy improves as the wavelength scanning progresses.
  • Achieved an accuracy of 1 µm with a scanning width of 25 nm.

    • Conclusions:

    • Wavelength scanning profilometry is effective for real-time surface shape measurement.
    • The proposed method offers increasing accuracy with extended scanning.
    • Demonstrated suitability for both specular and diffuse surfaces.