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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
M Barni1, F Bartolini, A De Rosa
1Department of Information Engineering, University of Siena, 53100-Siena, Italy. barni@dii.unisi.it
This study introduces a new method to evaluate digital watermark capacity, crucial for understanding data hiding limits in images. The research extends previous work beyond simple additive watermarks to non-additive, non-Gaussian scenarios.
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