Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Invariant error metrics for image reconstruction.

J R Fienup

    Applied Optics
    |February 12, 2008
    PubMed
    Summary
    This summary is machine-generated.

    This study introduces a novel image error metric, crucial for phase retrieval. The metric offers invariance to common image distortions, enhancing its utility in scientific imaging applications.

    Related Experiment Videos

    Related Concept Videos

    You might also read

    Related Articles

    Articles linked to this work by shared authors, journal, and citation graph.

    Sort by
    Same author

    Single-shot femtosecond x-ray holography using extended references.

    Physical review letters·2010
    Same author

    Phase-retrieval algorithms for a complicated optical system.

    Applied optics·2010
    Same author

    Hubble Space Telescope characterized by using phase-retrieval algorithms.

    Applied optics·2010
    Same author

    Phase retrieval algorithms: a comparison.

    Applied optics·2010
    Same author

    Optical residue arithmetic computer with programmable computation modules.

    Applied optics·2010
    Same author

    Holographic optics for a matched-filter optical processor.

    Applied optics·2010
    Same journal

    Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

    Applied optics·2026
    Same journal

    High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

    Applied optics·2026
    Same journal

    Automated stitching interferometry for high-precision metrology of X-ray mirrors.

    Applied optics·2026
    Same journal

    Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

    Applied optics·2026
    Same journal

    High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

    Applied optics·2026
    Same journal

    Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

    Applied optics·2026
    See all related articles

    Area of Science:

    • Image processing
    • Optical metrology
    • Computational imaging

    Background:

    • Accurate image comparison is vital for scientific analysis, particularly in phase retrieval.
    • Existing error metrics often lack robustness against common image transformations.

    Purpose of the Study:

    • To develop a normalized root-mean-square error metric for image comparison.
    • To achieve invariance to specific image transformations relevant to phase retrieval.

    Main Methods:

    • Derivation of normalized root-mean-square error expressions.
    • Incorporation of invariance properties for scaling, phase shift, translation, and conjugation/rotation.
    • Development of parameter estimation for these transformations.

    Main Results:

    • Novel error metric expressions derived for image comparison.
    • Demonstrated invariance to constant scaling, phase addition, translation, and complex conjugation with 180-degree rotation.
    • Capability to estimate transformation parameters and compare wave fronts with piston and tilt terms.

    Conclusions:

    • The developed error metric enhances image analysis robustness, especially for phase retrieval.
    • The metric's invariance properties and parameter estimation capabilities offer significant advantages in optical and imaging sciences.