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Related Concept Videos

Raman Spectroscopy Instrumentation: Overview01:26

Raman Spectroscopy Instrumentation: Overview

A conventional Raman spectrophotometer includes a laser source, a sample holding system, a wavelength selector, and a detector.
The monochromatic laser source, typically using visible or near-infrared radiation, generates a highly focused beam of light. This light interacts with the molecules of the sample, scattering some of the light. Liquid and gaseous samples are usually tested in ordinary glass capillaries, while solids can be analyzed as powders packed in capillaries or as potassium...
IR Spectrometers01:25

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...

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Related Experiment Video

Updated: Jul 7, 2026

The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
09:10

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Published on: December 5, 2025

Multimode-laser reflectometer with a multichannel wavelength detector and its application.

T Funaba, N Tanno, H Ito

    Applied Optics
    |February 12, 2008
    PubMed
    Summary
    This summary is machine-generated.

    A new laser reflectometer was developed for precise thickness measurements. This instrument achieved high spatial resolution and accurately mapped coverglass thickness using interference patterns.

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    Area of Science:

    • Optical Metrology
    • Instrumentation Engineering

    Background:

    • Accurate measurement of thin film and material thickness is crucial in various scientific and industrial applications.
    • Existing techniques may have limitations in spatial resolution or detectable range.

    Purpose of the Study:

    • To develop and characterize a novel multimode-laser reflectometer for high-resolution thickness measurements.
    • To evaluate the performance of the developed instrument for practical applications.

    Main Methods:

    • Development of a multimode-laser reflectometer utilizing a multichannel wavelength detector.
    • Experimental evaluation of the instrument's spatial resolution and maximum detectable length.
    • Application of the reflectometer for thickness mapping of coverglass by analyzing interference fringes.

    Main Results:

    • Achieved a spatial resolution of 24 micrometers (µm).
    • Determined a maximum detectable length of 510 micrometers (µm).
    • Successfully mapped coverglass thickness, correlating well with interference fringe patterns.

    Conclusions:

    • The developed multimode-laser reflectometer is a viable tool for precise, high-resolution thickness measurements.
    • The instrument demonstrates potential for applications requiring detailed surface and subsurface analysis.