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Related Concept Videos

Lossless Lines01:23

Lossless Lines

In electrical engineering, a lossless transmission line is characterized by a purely imaginary propagation constant and a resistive characteristic impedance. The ABCD parameters, which describe the relationship between the input and output voltages and currents, indicate an equivalent π circuit with an imaginary series impedance and a shunt admittance. This results in a transmission line that, when the product of the phase constant (beta) and the length of the line is less than pi, exhibits...

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Related Experiment Video

Updated: Jul 7, 2026

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source
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End-face scattering loss in integrated-optical waveguides.

H M Lee, M C Oh, H Park

    Applied Optics
    |February 12, 2008
    PubMed
    Summary

    A new method quantifies scattering loss in electro-optic polymer waveguides. This scattering, caused by end-face roughness, is a major factor in coupling loss and can now be reliably measured.

    Area of Science:

    • Optoelectronics
    • Materials Science

    Background:

    • Waveguide coupling loss is a critical parameter in optical device performance.
    • Scattering loss, particularly at the waveguide end-face, is a significant contributor to overall coupling loss.
    • Characterizing end-face scattering is essential for optimizing waveguide fabrication and integration.

    Purpose of the Study:

    • To present an experimental technique for accurately determining end-face scattering loss in electro-optic polymer channel waveguides.
    • To investigate the relationship between end-face roughness and scattering loss.
    • To provide a reliable method for analyzing various loss components in waveguides.

    Main Methods:

    • Combines the cut-back method with optimum end-fire coupling.
    • Experimental determination of scattering loss based on end-face characteristics.

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  • Analysis of roughness in guiding and cladding layers induced by cleaving.

    • Main Results:

    • Identified end-face scattering loss as a prominent source of waveguide coupling loss.
    • Demonstrated a strong dependence of scattering loss on the end-face roughness of guiding and cladding layers.
    • Validated the technique's ability to examine other loss mechanisms with ease and high reliability.

    Conclusions:

    • The developed technique provides accurate quantification of end-face scattering loss in electro-optic polymer waveguides.
    • End-face roughness, induced by cleaving, is a critical factor influencing scattering loss.
    • This method offers a versatile and reliable tool for comprehensive loss analysis in optical waveguides.