Analysis of order-statistic CFAR threshold estimators for improved ultrasonic flaw detection

J Saniie1, D T Nagle

  • 1Dept. of Electr. and Comput. Eng., Illinois Inst. of Technol., Chicago, IL.

Summary

Optimal bandpass filtering enhances flaw detection in ultrasonic testing by analyzing spectral data. This method, using order-statistic processors, robustly identifies flaws even with interfering grain scatterers.