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Cr /sc multilayers for the soft-x-ray range.

F Schäfers, H C Mertins, F Schmolla

|February 13, 2008

Summary

This summary is machine-generated.

Researchers studied ultrathin chromium/scandium (Cr/Sc) multilayers for polarimeter applications. These nanolayers demonstrated effective polarizing and phase-shifting properties, confirming theoretical performance for soft X-ray applications.

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Area of Science:

Materials Science
Optics
Synchrotron Radiation Physics

Background:

Development of advanced optical elements for soft X-ray applications is crucial.
Polarimeters require precise control over light polarization and phase.
Ultrathin multilayers offer tunable optical properties.

Purpose of the Study:

To systematically investigate ultrathin Cr/Sc multilayers for use in soft X-ray polarimetry.
To optimize multilayers for normal incidence and 45-degree configurations.
To evaluate their performance as polarizing and phase-retarding elements.

Main Methods:

Sputter deposition of Cr/Sc multilayers on Si wafers and Si(3)N(4) membranes.
Characterization using tunable soft-X-ray synchrotron radiation.
Experimental validation of reflection and transmission properties.

Main Results:

Achieved 7% peak reflectance at 395 eV for normal incidence.
Observed significant phase-shifting effects below absorption edges.
Confirmed experimental performance matching theoretical predictions for polarizing and phase-retarding capabilities.

Conclusions:

Ultrathin Cr/Sc multilayers are effective for soft X-ray polarimetry.
Optimized multilayers perform as predicted for polarizing and phase-retarding elements.
Demonstrated potential for use in reflection and transmission polarimetry setups.