Updated: Jul 7, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Behzad Sharif1, Farzad Kamalabadi
1Department of Electrical and Computer Engineering and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA. sharif@uiuc.edu
This study introduces a novel algorithm for optimizing sensor configurations in remote imaging. The developed method efficiently finds the best sensor placement, improving image quality and performance in applications like tomographic imaging.
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