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Quantification of small, convex particles by TEM.

Sigmund J Andersen¹, Børge Holme, Calin D Marioara

¹SINTEF Materials and Chemistry, Department of Synthesis and Properties, Material Physics, Trondheim, Norway. sigmund.j.andersen@sintef.no

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Summary

This summary is machine-generated.

This study presents a modified Schwartz-Saltykov method to accurately determine particle size distributions from transmission electron microscopy (TEM) images, correcting for surface-cut particles. The approach yields a more accurate 3D size distribution, considering particle shape and material properties.

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Area of Science:

Materials Science
Microscopy
Data Analysis

Background:

Transmission electron microscopy (TEM) is crucial for analyzing particle size distributions.
Surface-truncated particles in TEM images lead to inaccurate size distribution data.
Accurate particle size analysis is vital for understanding material properties.

Purpose of the Study:

To develop a robust method for correcting particle size distributions obtained from TEM images.
To accurately determine the true size distribution of non-overlapping, arbitrarily oriented particles.
To estimate the real 3D particle size distribution by accounting for particle shape.

Main Methods:

A variation of the Schwartz-Saltykov method is employed.
Observed size distributions are corrected using a matrix inversion technique.
The matrix incorporates thickness-dependent Scheil or Schwartz-Saltykov terms.
Particle shape is considered for estimating the real 3D distribution.

Main Results:

A corrected size distribution for particle projections, excluding surface-cut effects, is obtained.
The method successfully estimates the real 3D particle size distribution.
Examples using spheres and pill-box shaped dispersoids in an Al-Mg-Si alloy demonstrate the method's applicability.
Detailed error analysis is provided.

Conclusions:

The modified Schwartz-Saltykov method provides accurate particle size distributions from TEM images.
This technique effectively corrects for artifacts introduced by surface-truncated particles.
The study offers a computational tool and practical examples for materials characterization.