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High Q-factor distributed bragg reflector resonators with reflectors of arbitrary thickness
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
|February 16, 2008
Summary
This study introduces a new Bragg resonator design that significantly boosts resonator quality (Q-factor) by minimizing energy loss. This advancement offers superior performance compared to traditional whispering gallery mode resonators.
Area of Science:
- Electromagnetics and Applied Physics
- Materials Science and Engineering
Background:
- The Bragg reflection technique enhances resonator Q-factor by minimizing conductor and dielectric losses using a low-loss resonant core and distributed Bragg reflector layers.
- Existing models often require Bragg reflectors to be precisely lambda/4 thick, limiting design flexibility.
Discussion:
- A novel, simple non-Maxwellian model was developed to design cylindrical Bragg resonators with arbitrary dielectric reflector thicknesses.
- The model accommodates higher-order field variations in both resonant and anti-resonant regions, enabling versatile resonator designs.
- Three distinct resonators were fabricated using single-crystal sapphire, varying only the cavity dimensions.
Key Insights:
- An unloaded Q-factor of 234,000 at 9.7 GHz was experimentally achieved for the fundamental mode.
- The Bragg resonator demonstrated a higher Q-factor than conventional whispering gallery mode resonators.
- Significantly reduced spurious mode density was observed compared to overmoded whispering gallery resonators.
Outlook:
- This work provides a simplified yet effective modeling approach for designing high-performance Bragg resonators.
- The demonstrated high Q-factor and low spurious modes suggest potential applications in sensitive microwave and millimeter-wave devices.
- Further research could explore different dielectric materials and resonator geometries to optimize performance for specific frequency ranges.

