Related Experiment Video
Updated: Jul 7, 2026

05:57
Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Addendum to 'Possible design procedure for low-loss 180 degrees reflecting arrays in SAW devices' (Jan 88 57-60)
1Dept. of Eng. Sci., Oxford Univ., UK.
Abstract:
The original paper (ibid., vol.35, no.1, p.57-60, 1988) describes how multiple reflections can be allowed for in SAW reflecting arrays. Comments are now made on the error in frequency response due to truncation of the array to finite length, and on multiple transits between transducers via the array.