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Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
1Moore Sch. of Electr. Eng., Pennsylvania Univ., Philadelphia, PA.
This study introduces array redundancy for active imaging arrays, defining minimum and reduced redundancy line arrays. These novel active arrays offer different geometries and element counts compared to passive systems.
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2026-06-19T13:36:07.907641+00:00