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Updated: Jul 7, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Atomic-scale chemical imaging of composition and bonding by aberration-corrected microscopy

D A Muller1, L Fitting Kourkoutis, M Murfitt

  • 1Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA. dm24@cornell.edu

Science (New York, N.Y.)
|February 23, 2008
PubMed

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