Diffraction tomographic reconstruction from intensity data
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Updated: Jul 7, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
1Dept. of Electr. and Comput. Eng., Northeastern Univ., Boston, MA.
Abstract:
The problem of reconstructing the complex index of refraction of a weakly inhomogeneous scattering object from measurements of the magnitude (intensity) of the transmitted wavefields in a set of scattering experiments within the context of diffraction tomography (DT) is addressed. It is shown that high quality approximate reconstructions can be obtained from such intensity data using standard reconstruction procedures of DT. The physical basis for the success of these procedures when applied to intensity data is discussed and computer simulations are presented comparing the approximate reconstructions generated from intensity data with the optimum reconstructions generated from both the magnitude and phase of the transmitted wavefields.
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