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Interference and Diffraction02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
The de Broglie Wavelength02:32

The de Broglie Wavelength

In the macroscopic world, objects that are large enough to be seen by the naked eye follow the rules of classical physics. A billiard ball moving on a table will behave like a particle; it will continue traveling in a straight line unless it collides with another ball, or it is acted on by some other force, such as friction. The ball has a well-defined position and velocity or well-defined momentum, p = mv, which is defined by mass m and velocity v at any given moment. This is the typical...

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Related Experiment Video

Updated: Jul 7, 2026

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
08:44

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene

Published on: August 22, 2017

Revised formulas for diffraction effects with point and extended sources.

E L Shirley

    Applied Optics
    |February 28, 2008
    PubMed
    Summary

    New radiometry formulas accurately estimate diffraction effects for various source types and apertures. These revised calculations offer improved or comparable performance to existing methods, simplifying diffraction analysis.

    Area of Science:

    • Optics and Photonics
    • Radiometry and Photometry
    • Metrology

    Background:

    • Diffraction effects significantly impact radiometric measurements, especially for point and extended sources.
    • Accurate estimation of diffraction is crucial for precise radiometric applications.
    • Existing formulas may have limitations in scope or complexity.

    Purpose of the Study:

    • To derive and validate revised formulas for estimating diffraction effects in radiometry.
    • To provide improved calculation methods for point and extended sources.
    • To cover a range of aperture types, including nonlimiting, large defining, and pinhole apertures.

    Main Methods:

    • Derivation of new mathematical formulas based on optical principles.
    • Comparison of the performance of revised formulas against established methods.

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    Published on: April 24, 2018

    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

    Published on: June 19, 2018

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    Last Updated: Jul 7, 2026

    Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
    08:44

    Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene

    Published on: August 22, 2017

    Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
    11:48

    Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography

    Published on: April 24, 2018

    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
    10:12

    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

    Published on: June 19, 2018

  • Application of formulas to specific examples involving different aperture geometries.

    • Main Results:

    • Revised formulas demonstrate accuracy comparable to or exceeding previous methods.
    • Some derived formulas are presented in closed form for ease of use.
    • Formulas are applicable to nonlimiting, large defining, and pinhole apertures.

    Conclusions:

    • The newly derived formulas offer a robust and potentially simpler approach to correcting radiometric measurements for diffraction.
    • These formulas enhance the precision of radiometry across diverse experimental setups.
    • The findings facilitate more accurate optical measurements in various scientific and engineering fields.