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15:04
Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Simulations of tip-enhanced optical microscopy reveal atomic resolution
Andrew Downes1, Donald Salter, Alistair Elfick
1Institute for Materials and Processes, University of Edinburgh, King's Buildings, Mayfield Road, Edinburgh, EH9 3JL, UK. andy.downes@ed.ac.uk
Journal of Microscopy
|February 29, 2008
Summary
Finite element analysis of scanning near-field optical microscope tips reveals that smaller radii significantly enhance optical scattering. This suggests potential for atomic resolution imaging with advanced nanoscale optical probes.
Area of Science:
- Nanotechnology
- Optical Microscopy
- Electromagnetism
Background:
- Scanning near-field optical microscopy (SNOM) is crucial for high-resolution imaging.
- Apertureless SNOM tips are key to overcoming resolution limits.
- Understanding tip-sample interactions is vital for optimizing SNOM performance.
Purpose of the Study:
- To perform finite element electromagnetic analysis of apertureless SNOM tips.
- To investigate the effect of tip radius on optical scattering enhancement.
- To evaluate the potential for atomic resolution imaging with nanoscale tips.
Main Methods:
- Finite element electromagnetic analysis was employed.
- Simulations covered tip radii from 40 nm down to 1 nm.
- Optical scattering was modeled in air and water for various metallic tip materials (Au, Ag, Cu, Al).
Main Results:
- Decreasing tip radius caused significant spectral shifts and increased optical scattering.
- Lateral resolution was consistently smaller than the tip radius.
- 1-nm-radius tips showed potential for atomic resolution with sufficient optical enhancement.
Conclusions:
- Nanoscale apertureless SNOM tips offer significant optical scattering enhancement.
- Tip radius is a critical parameter for controlling resolution and signal strength.
- Atomic resolution imaging is achievable with optimized nanoscale SNOM probes.
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