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Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
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Comparative study of the roughness of optical surfaces and thin films by use of X-ray scattering and atomic force

V E Asadchikov1, A Duparré, S Jakobs

  • 1Institute of Crystallography, Leninsky prospect 59, Moscow 117333 Russia.

Applied Optics
|February 29, 2008
PubMed

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