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Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

Published on: May 15, 2017

Single-beam interface thermal lensing.

M Gugliotti¹, M S Baptista, L G Dias

¹Departamento de Bioquímica, Instituto de Química, Universidade de Sāo Paulo, Av. Prof. Lineu Prestes 748, Sāo Paulo 05508-940, Brazil.

|February 29, 2008

Summary

A novel single-beam photothermal-lensing technique effectively studies interfaces. This method detects signals at a quartz-solution interface, revealing an optical element similar to an inverted thermal lens.

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Area of Science:

Analytical Chemistry
Physical Chemistry
Optics

Background:

Interface characterization is crucial in various scientific disciplines.
Photothermal techniques offer sensitive methods for probing material properties.

Purpose of the Study:

To present a simplified single-beam photothermal-lensing technique for interface analysis.
To investigate the optical properties of a quartz-solution interface using this method.

Main Methods:

Utilized a single-beam laser configuration for photothermal-lensing.
Analyzed the reflection signal from a quartz-solution interface.
Applied a conventional thermal lens model for data fitting.

Main Results:

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Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

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Successfully detected a photothermal signal from the quartz-solution interface.

The optical element formed at the interface was characterized.

The observed optical element was found to resemble an inverted thermal lens.

Conclusions:

The single-beam photothermal-lensing technique is viable for interface studies.
The quartz-solution interface exhibits unique optical characteristics under photothermal influence.