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Related Concept Videos

Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle01:19

Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle

Inductively coupled plasma (ICP) is the most widely used plasma source in atomic emission spectroscopy (AES), also known as Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES). The ICP source, or torch, consists of three concentric quartz tubes with argon gas flowing through them. A spark from a Tesla coil initiates the ionization of argon, generating a high-temperature plasma.
The ions and electrons produced interact with the fluctuating magnetic field created by a water-cooled...
Atomic Fluorescence Spectroscopy01:29

Atomic Fluorescence Spectroscopy

Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which are...
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
Atomic Emission Spectroscopy: Interference01:30

Atomic Emission Spectroscopy: Interference

In atomic emission spectroscopy (AES), high-temperature atomizers excite a broad range of elements and molecules that generate complex emissions from sources such as oxides, hydroxides, and flame combustion products in the flame or plasma. Several strategies can be employed to minimize spectral interferences caused by overlapping emission lines or bands. These include increasing instrument resolution, choosing alternative emission lines, optimally placing the detector in low-background regions,...

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An Atmospheric Pressure Plasma Setup to Investigate the Reactive Species Formation
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rf plasma system as an atomic oxygen exposure facility.

Z Shpilman1, I Gouzman, G Lempert

  • 1Space Environment Section, Soreq NRC, Yavne 81800, Israel.

The Review of Scientific Instruments
|March 5, 2008
PubMed
Summary
This summary is machine-generated.

This study developed a low-cost radiofrequency plasma system to simulate atomic oxygen (AO) and vacuum ultraviolet (VUV) radiation in low Earth orbit (LEO). The system effectively reduces unwanted excited species and ions, ensuring AO is the dominant reactive element for accurate material testing.

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Area of Science:

  • Spacecraft materials engineering
  • Plasma physics
  • Materials science

Background:

  • Spacecraft materials in low Earth orbit (LEO) face degradation from atomic oxygen (AO) and solar ultraviolet (UV) radiation.
  • Existing radiofrequency (rf) oxygen plasma facilities for simulating LEO conditions can produce complex environments with ions, excited species, and VUV radiation, potentially leading to inaccurate material reactivity assessments.

Purpose of the Study:

  • To develop a simple, low-cost rf plasma system for generating a well-defined atomic oxygen (AO) and vacuum ultraviolet (VUV) environment for materials testing.
  • To characterize the plasma afterglow and assess its suitability for simulating LEO conditions accurately.

Main Methods:

  • Designed an rf plasma system with two right-angle turns to constrain the afterglow flow.
  • Characterized the afterglow using optical emission spectroscopy, current measurements, and UV radiation measurements at three locations.
  • Exposed Kapton® samples to the plasma at different locations and evaluated material degradation via mass loss and surface modification using atomic force microscopy.

Main Results:

  • A significant reduction in ionic and excited species, as well as UV radiation, was observed as the plasma afterglow passed through the right-angle turns.
  • Recombination and collisions with chamber walls were identified as mechanisms for charged particle reduction.
  • Radiation absorption by chamber walls explained the decrease in UV radiation flux.

Conclusions:

  • The developed rf plasma system effectively minimizes interfering species and radiation, creating a more accurate simulation of the LEO environment.
  • Ground-state atomic oxygen (AO) is confirmed as the dominant reactive species in the plasma afterglow after the turns.
  • This system offers a reliable and cost-effective method for screening spacecraft materials for LEO applications.