Joint processing of hartmann sensor and conventional image measurements to estimate large aberrations: theory and

M C Roggemann1, T J Schulz, C W Ngai

  • 1Department of Electrical Engineering, Michigan Technological University, 1400 Townsend Drive, Houghton, Michigan 49931, USA. mroggema@mtu.edu

Applied Optics
|March 6, 2008
PubMed

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