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In-plane rotation analysis by two-wavelength electronic speckle interferometry.

A K Nassim1, L Joannes, A Cornet

  • 1Laboratoire d'Optique Appliquée, Universit Catholique de Louvain, Unité de Physique Atomique, Moleculaire et Optique, Chemin du cyclotron 2, B-1348 Louvain-La-Neuve, Belgium.

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This study introduces a straightforward method for measuring in-plane object rotation using electronic speckle pattern interferometry and a two-wavelength laser diode. The technique simplifies rotation angle measurement through fringe tilt determination.

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Area of Science:

  • Optical metrology
  • Interferometry
  • Speckle pattern analysis

Background:

  • In-plane rotation measurement is crucial for various engineering applications.
  • Conventional methods can be complex or limited in scope.
  • Electronic Speckle Pattern Interferometry (ESPI) is sensitive to in-plane displacements.

Purpose of the Study:

  • To develop a simple and effective method for measuring in-plane rotation angle and sign.
  • To combine ESPI with the two-wavelength laser diode method for enhanced measurement capabilities.
  • To demonstrate the feasibility of fringe tilt analysis for rotation determination.

Main Methods:

  • Utilizing in-plane sensitive electronic speckle pattern interferometry (ESPI).
  • Integrating the two-wavelength laser diode method with ESPI.
  • Analyzing fringe tilt patterns to determine rotation angle and sign.

Main Results:

  • Successful measurement of in-plane rotation angle and sign was achieved.
  • The method demonstrated simplicity in determining rotation via fringe tilt.
  • Experimental validation of the proposed technique was presented.

Conclusions:

  • The combined ESPI and two-wavelength laser diode method offers a simple approach for in-plane rotation measurement.
  • Fringe tilt analysis is an effective parameter for quantifying rotation.
  • This technique provides a valuable tool for optical metrology and engineering analysis.