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Updated: Jul 6, 2026

A Multimodal Wide-Field Fourier-Transform Raman Microscope
Published on: December 30, 2025
Instrument line shape of fourier transform spectrometers: analytic solutions for nonuniformly illuminated off-axis
1Département de Génie Electrique et de Génie Informatique, Universite Laval, Centre d'Optique, Photonique et Laser, Québec, Canada. jgenest@gel.ulaval.ca
Abstract:
A simple and powerful method for obtaining analytic instrument line shapes (ILS's) for Fourier transform spectrometers is explained. ILS's for off-axis circular and rectangular detectors are calculated to illustrate the method. Results match earlier ILS simulations. The contribution of the nonuniformity of light intensity across the detector surface is also taken into account.
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